{"id":18659906,"url":"https://github.com/ssomnath/thermal_image_processing","last_synced_at":"2026-01-23T06:47:19.309Z","repository":{"id":68540580,"uuid":"133167772","full_name":"ssomnath/thermal_image_processing","owner":"ssomnath","description":"Simple routines for processing AFM thermal topography imaging results","archived":false,"fork":false,"pushed_at":"2018-05-12T20:25:55.000Z","size":60,"stargazers_count":0,"open_issues_count":0,"forks_count":0,"subscribers_count":1,"default_branch":"master","last_synced_at":"2025-05-18T02:09:50.384Z","etag":null,"topics":["afm","atomic-force-microscopy","image-processing","imaging","scanning-probe-microscopy","spm","thermal"],"latest_commit_sha":null,"homepage":null,"language":"IGOR Pro","has_issues":true,"has_wiki":null,"has_pages":null,"mirror_url":null,"source_name":null,"license":"gpl-3.0","status":null,"scm":"git","pull_requests_enabled":true,"icon_url":"https://github.com/ssomnath.png","metadata":{"files":{"readme":"README.rst","changelog":null,"contributing":null,"funding":null,"license":"LICENSE","code_of_conduct":null,"threat_model":null,"audit":null,"citation":null,"codeowners":null,"security":null,"support":null,"governance":null,"roadmap":null,"authors":null,"dei":null,"publiccode":null,"codemeta":null}},"created_at":"2018-05-12T17:20:18.000Z","updated_at":"2018-05-12T20:27:07.000Z","dependencies_parsed_at":"2023-02-27T22:46:24.464Z","dependency_job_id":null,"html_url":"https://github.com/ssomnath/thermal_image_processing","commit_stats":null,"previous_names":[],"tags_count":0,"template":false,"template_full_name":null,"purl":"pkg:github/ssomnath/thermal_image_processing","repository_url":"https://repos.ecosyste.ms/api/v1/hosts/GitHub/repositories/ssomnath%2Fthermal_image_processing","tags_url":"https://repos.ecosyste.ms/api/v1/hosts/GitHub/repositories/ssomnath%2Fthermal_image_processing/tags","releases_url":"https://repos.ecosyste.ms/api/v1/hosts/GitHub/repositories/ssomnath%2Fthermal_image_processing/releases","manifests_url":"https://repos.ecosyste.ms/api/v1/hosts/GitHub/repositories/ssomnath%2Fthermal_image_processing/manifests","owner_url":"https://repos.ecosyste.ms/api/v1/hosts/GitHub/owners/ssomnath","download_url":"https://codeload.github.com/ssomnath/thermal_image_processing/tar.gz/refs/heads/master","sbom_url":"https://repos.ecosyste.ms/api/v1/hosts/GitHub/repositories/ssomnath%2Fthermal_image_processing/sbom","scorecard":null,"host":{"name":"GitHub","url":"https://github.com","kind":"github","repositories_count":286080680,"owners_count":28682261,"icon_url":"https://github.com/github.png","version":null,"created_at":"2022-05-30T11:31:42.601Z","updated_at":"2026-01-23T05:48:07.525Z","status":"ssl_error","status_checked_at":"2026-01-23T05:48:07.129Z","response_time":59,"last_error":"SSL_read: unexpected eof while reading","robots_txt_status":"success","robots_txt_updated_at":"2025-07-24T06:49:26.215Z","robots_txt_url":"https://github.com/robots.txt","online":false,"can_crawl_api":true,"host_url":"https://repos.ecosyste.ms/api/v1/hosts/GitHub","repositories_url":"https://repos.ecosyste.ms/api/v1/hosts/GitHub/repositories","repository_names_url":"https://repos.ecosyste.ms/api/v1/hosts/GitHub/repository_names","owners_url":"https://repos.ecosyste.ms/api/v1/hosts/GitHub/owners"}},"keywords":["afm","atomic-force-microscopy","image-processing","imaging","scanning-probe-microscopy","spm","thermal"],"created_at":"2024-11-07T07:38:18.723Z","updated_at":"2026-01-23T06:47:19.295Z","avatar_url":"https://github.com/ssomnath.png","language":"IGOR Pro","funding_links":[],"categories":[],"sub_categories":[],"readme":"Thermal Image Processing\n=========================\n**Suhas Somnath**\n\nThis simple standalone Igor-Po procedure file facilitates simple routines for processing results from AFM topography imaging using silicon self-heating AFM cantilevers. It was mainly used for purposes such as:\n\n* Characterizing sensitivity and resolution for thermal topography imaging performed on standardized square grating samples\n* Scaling voltage values to nanometers once the sensitivity and resolution were known\n* Inverting images when images were acquiring using resistance control\n* Adding an offset to all values in a channel - great for centering at 0 V\n* Simple edge filtering\n* Flipping the image vertically\n* Clipping artifacts (spikes) in the signals that would occur at sharp vertical edges of gratings by coercing the values to lie within a min and max\n* Replacing the contents of a layer with data present in a text file (relevant if the data of interest was acquired using an alternate source such as a National Instruments Data Acquisition system but if the user prefers to use Asylum Research's / Igor Pro for further image analysis)\n* Deconvolving the shape of the cantilever heater from the measured image. See this paper for more information.\n\nDisclaimer\n----------\nThis code was developed from 2010 to 2012 for Asylum Research software versions of 090909. It may or may not work now\n\nJournal papers using this software\n-----------------------------------\n1. Somnath, Suhas, Elise A. Corbin, and William P. King. \"Improved nanotopography sensing via temperature control of a heated atomic force microscope cantilever.\" IEEE Sensors Journal 11, no. 11 (2011): 2664-2670.\n2. Kim, Hoe Joon, Nicolaie Moldovan, Jonathan R. Felts, Suhas Somnath, Zhenting Dai, Tevis DB Jacobs, Robert W. Carpick, John A. Carlisle, and William P. King. \"Ultrananocrystalline diamond tip integrated onto a heated atomic force microscope cantilever.\" Nanotechnology 23, no. 49 (2012): 495302.\n3. Lee, Byeonghee, Suhas Somnath, and William P. King. \"Fast nanotopography imaging using a high speed cantilever with integrated heater–thermometer.\" Nanotechnology 24, no. 13 (2013): 135501.\n4. Somnath, Suhas, and William P. King. \"Heated atomic force cantilever closed loop temperature control and application to high speed nanotopography imaging.\" Sensors and Actuators A: Physical 192 (2013): 27-33.\n5. Liu, Joseph O., Suhas Somnath, and William P. King. \"Heated atomic force microscope cantilever with high resistivity for improved temperature sensitivity.\" Sensors and Actuators A: Physical 201 (2013): 141-147.\n6. Somnath, Suhas, Hoe Joon Kim, Huan Hu, and William P. King. \"Parallel nanoimaging and nanolithography using a heated microcantilever array.\" Nanotechnology 25, no. 1 (2013): 014001.\n7. Seong, Myunghoon, Suhas Somnath, Hoe Joon Kim, and William P. King. \"Parallel nanoimaging using an array of 30 heated microcantilevers.\" RSC Advances 4, no. 47 (2014): 24747-24754.\n8. Somnath, Suhas, and William P. King. \"An investigation of heat transfer between a microcantilever and a substrate for improved thermal topography imaging.\" Nanotechnology 25, no. 36 (2014): 365501.\n9. Somnath, Suhas, Joseph O. Liu, Mete Bakir, Craig B. Prater, and William P. King. \"Multifunctional atomic force microscope cantilevers with Lorentz force actuation and self-heating capability.\" Nanotechnology 25, no. 39 (2014): 395501.\n","project_url":"https://awesome.ecosyste.ms/api/v1/projects/github.com%2Fssomnath%2Fthermal_image_processing","html_url":"https://awesome.ecosyste.ms/projects/github.com%2Fssomnath%2Fthermal_image_processing","lists_url":"https://awesome.ecosyste.ms/api/v1/projects/github.com%2Fssomnath%2Fthermal_image_processing/lists"}